BrightLine Quadband beamsp. BS 409/493/573/652

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产品名称: BrightLine Quadband beamsp. BS 409/493/573/652

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BrightLine Quadband beamsp. BS 409/493/573/652 的详细介绍

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AOI 45° Reflection 381-404, 461-488, 543-566 and 626-644 nm Transmission 414-450, 500-530,... more

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Product information "BrightLine Quadband beamsp. BS 409/493/573/652"

AOI 45°
Reflection 381-404, 461-488, 543-566 and 626-644 nm
Transmission 414-450, 500-530, 580-611 and 660-800 nm
size 25,2 x 35,6 x 1,1 mm

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OrderNo.:	FF409/493/573/652-Di02-25x36
Reflection Band 1:	R_avg > 95% 350 - 404 nm
Edge Wavelength 1:	409 nm
Transmission Band 1:	T_avg > 93% 414 - 450 nm
Reflection Band 2:	R_avg > 95% 461 - 487.5 nm
Edge Wavelength 2:	493 nm
Transmission Band 2:	T_avg > 93% 499.5 - 530 nm
Reflection Band 3:	R_avg > 95% 543 - 566 nm
Edge Wavelength 3:	573 nm
Transmission Band 3:	T_avg > 93% 580 - 611 nm
Reflection Band 4:	R_avg > 95% 626 - 644 nm
Edge Wavelength 4:	652 nm
Transmission Band 4:	T_avg > 93% 659.5 - 850 nm
Angle of Incidence (AOI):	45 ± 1.5 degrees
Cone Half-angle (CHA):	2 degrees
Optical Damage Rating:	Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm²) for over 500 hrs.
Steepness:	Standard
Filter Effective Index:	1.75 Understanding Effective Index of Refraction n_eff
Flatness / RWE Classification:	Standard Epi-fluorescence"
Reflected Wavefront Error:	>> 6 lambda P-V RWE @ 632.8 nm
Transverse Dimensions (LxW):	25.2 mm x 35.6 mm
Transverse Tolerance (mounted):	± 0.1 mm
Filter Thickness (unmounted):	1.05 mm
Filter Thickness Tolerance (unmounted):	± 0.05 mm
Clear Aperture:	≥ 80% (elliptical)
Scratch-Dig:	60-40
Substrate Thickness (unmounted):	1.05 mm
Orientation:	Reflective surface marked with part number - Orient in direction of incoming light
Substrate Type:	low-autofluorescence optical quality glass

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