BrightLine Triple Laser beamsplitter R488/543/635

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产品名称: BrightLine Triple Laser beamsplitter R488/543/635

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BrightLine Triple Laser beamsplitter R488/543/635 的详细介绍

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AOI 45° Reflection 471-491, 541-544 and 633 – 647 nm Transmission 503-527, 560-616 and 666-800... more

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Product information "BrightLine Triple Laser beamsplitter R488/543/635"

AOI 45°
Reflection 471-491, 541-544 and 633 – 647 nm
Transmission 503-527, 560-616 and 666-800 nm
Dimension 25,2 x 35,6 x 1,1 mm

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OrderNo.:	Di01-R488/543/635-25x36
Reflection band 1:	R_abs > 94% 471 - 491 nm
Reflection Band 1 (p-pol):	R_abs > 90% 471 - 491 nm
Reflection Band 1 (s-pol):	R_abs > 98% 471 - 491 nm
Transmission band 1:	T_avg > 93% 503 - 526.5 nm
Reflection band 2:	R_abs > 94% 541.5 - 544.5 nm
Reflection band 3:	R_abs > 94% 632.8 - 647.1 nm
Reflection band 3 (p-pol):	R_abs > 90% 632.8 - 647.1 nm
Reflection band 3 (s-pol):	R_abs > 98% 632.8 - 647.1 nm
Transmission band 2:	T_avg > 93% 560 - 615.5 nm
Transmission band 3:	T_avg > 93% 665.5 - 800 nm
Laser Wavelength 1:	473 +/- 2 nm, 488 +3/-2 nm
Laser Wavelength 2:	543.5 nm
Laser Wavelength 3:	632.8 nm, 635 +7/-0 nm, 647.1 nm
Angle of Incidence (AOI):	45 degrees with a shift of 0.35%/degree (40 - 50 degrees)
AOI Tolerance:	Shift of 0.35%/degree (40 - 50 degrees)
Cone Half-angle (CHA):	0.5 degrees
Optical Damage Rating:	2 J/cm² at 532 nm (for a 532nm filter)
Steepness:	Steep
Filter Effective Index:	1.86 Understanding Effective Index of Refraction n_eff
Flatness / RWE Classification:	Laser"
Reflected Wavefront Error:	< 6 lambda P-V RWE @ 632.8 nm
Transverse Dimensions (LxW):	25.2 mm x 35.6 mm
Transverse Tolerance (mounted):	± 0.1 mm
Filter Thickness (unmounted):	1.05 mm
Filter Thickness Tolerance (unmounted):	± 0.05 mm
Clear Aperture:	≥ 80% (elliptical)
Scratch-Dig:	60-40
Substrate Thickness (unmounted):	1.05 mm
Orientation:	Reflective surface marked with part number - Orient in direction of incoming light
Substrate Type:	Fused Silica
Substrate Type:	low-autofluorescence optical quality glass

Scratch-Dig:	60-40
Edge steepness:	Standard für Fluoreszenz
Suitable for:	Laser applications
Number of Bands/Edges/Notches:	3
Damage Threshold:	2 J/cm² @ 532 nm (for a 532 nm filter)
Manufacturer:	Semrock

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