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Strahlenteiler HC BS 397

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产品名称: Strahlenteiler HC BS 397
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Strahlenteiler HC BS 397


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AOI 45° Reflexion 330 - 380 nm >98% (durchschn.) Transmission 414 - 665 nm >93% (durchschn. 25.2... more
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Product information "Strahlenteiler HC BS 397"
AOI 45°
Reflexion 330 - 380 nm >98% (durchschn.)
Transmission 414 - 665 nm >93% (durchschn.
25.2 x 35.6 x 1.1 mm
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Specifications

OrderNo.: FF397-Di01-25x36
Reflection Band 1: Ravg > 98% 330 - 380 nm
Transmission Band 1: Tavg > 93% 414 - 655 nm
Edge Wavelength 1: 397
Reflection Band 2: Ravg > 98% 446 - 500 nm
Transmission Band 2: Tavg > 93% 513 - 725 nm
Angle of Incidence (AOI): 45 ± 1.5 degrees
Cone Half-angle (CHA): 2 degrees
Optical Damage Rating: Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs.
Filter Effective Index: 1.78
Understanding ‘Effective Index of Refraction’ neff
Flatness / RWE Classification:
Standard Epi-fluorescence"
Reflected Wavefront Error: >> 6 lambda P-V RWE @ 632.8 nm
Steepness: Standard
Transverse Dimensions (LxW): 25.2 mm x 35.6 mm
Transverse Tolerance (mounted): ± 0.1 mm
Filter Thickness (unmounted): 1.05 mm
Filter Thickness Tolerance (unmounted): ± 0.05 mm
Clear Aperture: ≥ 80%
Scratch-Dig: 60-40
Substrate Thickness (unmounted): 1.05 mm
Orientation: Reflective surface marked with part number - Orient in direction of incoming light
Substrate Type: low-autofluorescence optical quality glass
Flatness: nicht definiert
Scratch-Dig: 60-40
Edge steepness: Standard für Fluoreszenz
Number of Bands/Edges/Notches: 1
Suitable for: Epifluorescence
Damage Threshold: no signs of degradation acc. to testing
Type of beamsplitter: Longpass
Manufacturer: Semrock
substrate thickness: 1nm
CWL/EdgeWL/NotchWL (nm): 397 nm
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  • Ascii-Daten - F38-396
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